WITHSYSTEM | 위드시스템

Company Name	WITHSYSTEM
Booth Number	I122
Home Page	www.withsystem.co.kr
Main Phone	054-465-7980

Company Introduction

"WithSystem Co., Ltd. has grown since starting the 
display post-process inspection business in 2002 
and has built a semiconductor test socket factory 
to enter new businesses in 2023. The 
semiconductor test socket (IC Test Socket) is an 
essential component for the final inspection during 
the semiconductor manufacturing process, and all 
semiconductors that have completed the final 
packaging process must be inspected to ensure 
whether there are no problems or not. At this 
time, the consumable parts used during the 
inspection process to determine whether the 
semiconductor is normal or defective are called 
test sockets. With System is capable of processing 
Al Metal and all types of engineering plastics and 
has hole processing technology of 0.1mm and 
equippedwitha production capacity of more than 
2,000 units per month. WithSystem is capable of 
processing Al Metal and all types of engineering 
plastics and boasts hole processing technology of 
0.1mm. 
Spring Contact Probe is a test consumable that is 
inserted into a semiconductor test socket and 
performs tests by directly contacting the 
semiconductor"

Introduction of item

1. IC Test Socket(QFP_SOCKET)

"Model Name            QFP_SOCKET
Package Type             32 ~ 240 Pin
    Pitch                    0.4mm ~ 1.0mm
Characteristics               Standard"

2. Spring Contact Probe For IC Test(Fine Barrel Probe(Pitch 0.2mm))

"TOP                          Pd Alloy
BARREL                    Ni-Au Alloy / Au Plated (FineBarrel)
BOTTOM                   Pd Alloy
SPRING                 SWP / Au Plated 
Spring Force(±20%) Force 2.0gf, Travel 0.3mm, Full Travel 0.5mm"