ZEISS KOREA | 자이스코리아

Company Name	ZEISS KOREA
Booth Number	C113
Home Page	www.zeiss.co.kr/microscopy
Main Phone	02-1661-3140

Company Introduction

ZEISS Korea provides optical, electron, X-ray microscopy and analysis software solutions for precise imaging 
and 3D analysis in 
semiconductor, nanomaterials and quantum device research.

Introduction of item

1. Field Emission Scanning Electron Microscope

A FE-SEM solution for high-resolution imaging at low voltage, enabling precise observation of quantum 
devices, thin films, nanomaterials 
and semiconductor structures.

2. Focused Ion Beam-Scanning Electron Microscope

[ZEISS - Crossbeam]
A FIB-SEM solution combining SEM imaging and FIB milling for cross-sectioning, TEM lamella preparation 
and 3D volume imaging of 
quantum and semiconductor devices.

3. 3D X-ray Microscope

[ZEISS - VersaXRM]
A high-resolution 3D X-ray microscopy solution for non-destructive analysis of internal defects, interfaces 
and structures in quantum 
packaging and advanced materials.

4. SEM Automation Workflow Software

[ZEISS - Blockwise]
A visual programming software for SEM automation, standardizing microscope control, navigation, image 
analysis and measurements for 
repeatable inspection workflows.

5. Nanoscale X-ray Microscope

[ZEISS - Xradia Ultra]
A nanoscale X-ray microscope for non-destructive 3D imaging of internal structures and defects in quantum 
materials, thin films and 
multilayer devices.

6. Multimodal Correlative Imaging Software

[ZEISS - Atlas 5]
A correlative imaging software for navigating and linking SEM, FIB-SEM, light and X-ray microscopy data 
across multiple scales and 
modalities.

7. Microscopy Control and Analysis Software

[ZEISS - ZEN core]
A connected microscopy software suite for controlling ZEISS light, SEM and FIB-SEM systems and enabling 
efficient imaging, analysis and 
correlative workflows.