WINTEC | 윈텍

Company Name	WINTEC
Booth Number	J114
Home Page	www.wintec.co.kr/
Main Phone	031-429-2401

chevron_right Company Introduction

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chevron_right Introduction of item

1. WXI-CT160

산업용 Nano Focus X-Ray CT 검사기 
- High resolution inspection: Nano focal spot 0.5㎛(2D), 2.0㎛ (CT)
- Max available inspection area: 510 X 470 mm (device weight: less than 5kg )
- High speed CT technology: Cone Beam CT & Oblique CT 
- User-friendly interface providing: 3D Rendering, Automatic judgment function, Automatic navigator. AI 
judgment function.
- High Quality shooting image: Real time image quality improvement engine RT-HDR
- Application: Semiconductor, PCB, electrical and electronic device, SMT, secondary battery, etc.
- Semi-automatic inspection function
- Various measurement programs are installed as standard

2. WXI-130

산업용 Micro Focus X-Ray 검사기 

- High resolution inspection: Micro focal spot 4㎛(2D), 20㎛ (CT)
- Max available inspection area: 500 X 500 mm (device weight: less than 5kg )
- High speed CT technology: Cone Beam CT & Oblique CT (4sec available)
- User-friendly interface providing: 3D Rendering, Automatic judgment function, Automatic navigator. 
AI judgment function.
- High Quality shooting image: Real time image quality improvement engine RT-HDR
- Application: Semiconductor, PCB, electrical and electronic device, SMT, secondary battery, etc.
- Semi-automatic inspection function
- Various measurement programs are installed as standard