HIMS | 힘스

Company Name	HIMS
Booth Number	K107
Home Page	www.hims.co.kr/
Main Phone	032-821-2511

Company Introduction

Since its founding in 1999, HIMS Co., Ltd. has made steady progress in machine vision in general automation, display, and 
semiconductor fields. We have led the machine vision industry by developing and researching various applications such as IR Inner 
Crack Inspection System, Wafer Bump Inspection System, CIS/DDI Wafer AOI System, SMT 2D/3D AOI System, etc. in the semiconductor 
field.

Introduction of item

1. HIMS AI SYSTEM 'HAIF'

HAIF

The Next Generation Integrated AI Ecosystem for Inspection & Management
HAIF (Hims AI Framework) is a proprietary, high-performance AI system developed by Hims. It provides a comprehensive, end-to-end 
framework designed for seamless inspection, training, deployment, reporting, and lifecycle management using advanced Machine 
Learning.

Key Features & Capabilities
▶ Enables direct communication with Rule-based inspection programs via network protocols.
▶ Supports a user-friendly, web-based UI for effortless accessibility and monitoring.
▶ A unified ecosystem encompassing AI inspection, model training, real-world deployment, and systematic management.
▶ Engineered for high stability across both Windows and Linux environments.
▶ Flexible development and integration with support for C++, C#, Python, and Node.js.